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FTIR, XRD, SEM, TGA Investigations of Ammonium Dihydrogen Phosphate (ADP) Single Crystal

by A. Jegatheesan, J. Murugan, B. Neelagantaprasad, G. Rajarajan
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International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 53 - Number 4
Year of Publication: 2012
Authors: A. Jegatheesan, J. Murugan, B. Neelagantaprasad, G. Rajarajan
10.5120/8408-2040

A. Jegatheesan, J. Murugan, B. Neelagantaprasad, G. Rajarajan . FTIR, XRD, SEM, TGA Investigations of Ammonium Dihydrogen Phosphate (ADP) Single Crystal. International Journal of Computer Applications. 53, 4 ( September 2012), 15-18. DOI=10.5120/8408-2040

@article{ 10.5120/8408-2040,
author = { A. Jegatheesan, J. Murugan, B. Neelagantaprasad, G. Rajarajan },
title = { FTIR, XRD, SEM, TGA Investigations of Ammonium Dihydrogen Phosphate (ADP) Single Crystal },
journal = { International Journal of Computer Applications },
issue_date = { September 2012 },
volume = { 53 },
number = { 4 },
month = { September },
year = { 2012 },
issn = { 0975-8887 },
pages = { 15-18 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume53/number4/8408-2040/ },
doi = { 10.5120/8408-2040 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T20:53:15.521228+05:30
%A A. Jegatheesan
%A J. Murugan
%A B. Neelagantaprasad
%A G. Rajarajan
%T FTIR, XRD, SEM, TGA Investigations of Ammonium Dihydrogen Phosphate (ADP) Single Crystal
%J International Journal of Computer Applications
%@ 0975-8887
%V 53
%N 4
%P 15-18
%D 2012
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Ammonium dihydrogen Phosphate (ADP), crystals are good Second Harmonic Generators (SHG) having appreciable Non Linear Optical properties. Single crystals of ammonium dihydrogen phosphate were grown using slow evaporation technique at 30° C. In order to study of ADP, X-ray diffraction studies were carried out on the crystals using Bruker AXS D8 Advance X-ray diffractometer with Cu K? radiation. The grown single crystals have been analyzed with FT-IR, TGA measurements. Some novel results of a combined sequential study of growth spirals on the basal surface of the richly polytypic ADP crystals by scanning electron microscopy (SEM) is presented and discussed.

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Index Terms

Computer Science
Information Sciences

Keywords

Crystal growth Solution growth technique XRD FTIR SEM TGA

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