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A semi-parallel data acquisition method in electrical impedance tomography using undersampling technique

Adriano Regis Daniel J. Pagano Francisco R.M. Mota Marduck M. Henao
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A Semi-parallel Data Acquisition Method in Electrical Impedance Tomography using Undersampling Technique

by Adriano Regis, Daniel J. Pagano, Francisco R.M. Mota, Marduck M. Henao
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International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 186 - Number 23
Year of Publication: 2024
Authors: Adriano Regis, Daniel J. Pagano, Francisco R.M. Mota, Marduck M. Henao
10.5120/ijca2024923693

Adriano Regis, Daniel J. Pagano, Francisco R.M. Mota, Marduck M. Henao . A Semi-parallel Data Acquisition Method in Electrical Impedance Tomography using Undersampling Technique. International Journal of Computer Applications. 186, 23 ( May 2024), 1-7. DOI=10.5120/ijca2024923693

@article{ 10.5120/ijca2024923693,
author = { Adriano Regis, Daniel J. Pagano, Francisco R.M. Mota, Marduck M. Henao },
title = { A Semi-parallel Data Acquisition Method in Electrical Impedance Tomography using Undersampling Technique },
journal = { International Journal of Computer Applications },
issue_date = { May 2024 },
volume = { 186 },
number = { 23 },
month = { May },
year = { 2024 },
issn = { 0975-8887 },
pages = { 1-7 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume186/number23/a-semi-parallel-data-acquisition-method-in-electrical-impedance-tomography-using-undersampling-technique/ },
doi = { 10.5120/ijca2024923693 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-05-31T22:32:03+05:30
%A Adriano Regis
%A Daniel J. Pagano
%A Francisco R.M. Mota
%A Marduck M. Henao
%T A Semi-parallel Data Acquisition Method in Electrical Impedance Tomography using Undersampling Technique
%J International Journal of Computer Applications
%@ 0975-8887
%V 186
%N 23
%P 1-7
%D 2024
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Hardware and software aspects of a semiparallel electrical impedance microtomography (EIT) system designed for highspeed data acquisition employing cost-effective measurements via subsampling techniques are covered in this paper. We explore the effects of the Nyquist theorem on sampling EIT system implementations through software and hardware testing. These experiments focus on the benefits of a semi-parallel approach, which involves serializing the excitation current and integrating parallelism into acquisition measurement hardware, operating under sub-Nyquist conditions. This innovative methodology promises greater efficiency and performance, potentially increasing the capabilities of EIT systems in diverse applications.

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Index Terms

Computer Science
Information Sciences
Electrical impedance tomography
semi-parallel
undersampling

Keywords

Hardware implementation semi-parallel undersampling

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