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Reseach Article

Temperature Dependence of Propagation Delay Characteristic in LECTOR based CMOS Circuit

Published on December 2011 by Preeti Verma, R. A. Mishra
International Conference on Electronics, Information and Communication Engineering
Foundation of Computer Science USA
ICEICE - Number 6
December 2011
Authors: Preeti Verma, R. A. Mishra
531b3a89-b897-4817-891f-dac16fa4b262

Preeti Verma, R. A. Mishra . Temperature Dependence of Propagation Delay Characteristic in LECTOR based CMOS Circuit. International Conference on Electronics, Information and Communication Engineering. ICEICE, 6 (December 2011), 28-30.

@article{
author = { Preeti Verma, R. A. Mishra },
title = { Temperature Dependence of Propagation Delay Characteristic in LECTOR based CMOS Circuit },
journal = { International Conference on Electronics, Information and Communication Engineering },
issue_date = { December 2011 },
volume = { ICEICE },
number = { 6 },
month = { December },
year = { 2011 },
issn = 0975-8887,
pages = { 28-30 },
numpages = 3,
url = { /specialissues/iceice/number6/4310-iceice043/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Special Issue Article
%1 International Conference on Electronics, Information and Communication Engineering
%A Preeti Verma
%A R. A. Mishra
%T Temperature Dependence of Propagation Delay Characteristic in LECTOR based CMOS Circuit
%J International Conference on Electronics, Information and Communication Engineering
%@ 0975-8887
%V ICEICE
%N 6
%P 28-30
%D 2011
%I International Journal of Computer Applications
Abstract

Propagation Delay of CMOS circuit depends upon several parameters such as threshold voltage, supply voltage, cell size. Variation of threshold voltage may result in temperature inversion effect thus reducing the cell delay as temperature increases. Integrated circuits operating at scaled supply voltage consume low power at the cost of reduced speed. This paper presents the study of effect of temperature on propagation delay of LECTOR based NAND gate circuit and comparing that with conventional design for a temperature range 0f 25oC to 105oC.

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Index Terms

Computer Science
Information Sciences

Keywords

Leakage/Sub threshold current threshold voltage LECTOR circuit