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Impact of Width Variation of Global Inductive VLSI Interconnect Line
| International Conference on Electronics, Information and Communication Engineering |
| Foundation of Computer Science USA |
| ICEICE - Number 6 |
| December 2011 |
| Authors: Diwakar Singh, Gargi Khanna, Rajeevan Chandel |
| 0cbf4c5c-22d4-47f5-bfc3-444afb2d79b0 |
Diwakar Singh, Gargi Khanna, Rajeevan Chandel . Impact of Width Variation of Global Inductive VLSI Interconnect Line. International Conference on Electronics, Information and Communication Engineering. ICEICE, 6 (December 2011), 1-4.
Abstract
In this paper the impact of width variation is being addressed on transition time, power dissipation and crosstalk noise in coupled inductive lines for different switching patterns. The finding of simulation reveals that there is first decrease in transition delay and then it increases afterwards. It is also observed that power increases slowly with width increasing and also observed the crosstalk noise at the victim line for the increase in width.
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