CFP last date
20 March 2024
Reseach Article

Design of Adaptive Hold Logic (AHL) Circuit to Reduce Aging Effects

Published on June 2015 by Vaishali S. Chirde, Usha Jadhav
National Conference on Emerging Trends in Advanced Communication Technologies
Foundation of Computer Science USA
NCETACT2015 - Number 1
June 2015
Authors: Vaishali S. Chirde, Usha Jadhav
0b1eb6e7-bde1-4860-9ac0-c54eabeb1b9d

Vaishali S. Chirde, Usha Jadhav . Design of Adaptive Hold Logic (AHL) Circuit to Reduce Aging Effects. National Conference on Emerging Trends in Advanced Communication Technologies. NCETACT2015, 1 (June 2015), 26-29.

@article{
author = { Vaishali S. Chirde, Usha Jadhav },
title = { Design of Adaptive Hold Logic (AHL) Circuit to Reduce Aging Effects },
journal = { National Conference on Emerging Trends in Advanced Communication Technologies },
issue_date = { June 2015 },
volume = { NCETACT2015 },
number = { 1 },
month = { June },
year = { 2015 },
issn = 0975-8887,
pages = { 26-29 },
numpages = 4,
url = { /proceedings/ncetact2015/number1/20983-2017/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 National Conference on Emerging Trends in Advanced Communication Technologies
%A Vaishali S. Chirde
%A Usha Jadhav
%T Design of Adaptive Hold Logic (AHL) Circuit to Reduce Aging Effects
%J National Conference on Emerging Trends in Advanced Communication Technologies
%@ 0975-8887
%V NCETACT2015
%N 1
%P 26-29
%D 2015
%I International Journal of Computer Applications
Abstract

In VLSI, scaling methods plays an important role in reducing the power dissipation from one technology node to other technology node. The two major constraints for delay in any VLSI circuits are latency and throughput. The negative bias temperature instability (NBTI) effect occurs when a pMOS transistor is under negative bias (Vgs= -VDD) increasing the threshold voltage of pMOS transistor and reducing the speed. A similar phenomenon, positive bias temperature instability (PBTI) effect occurs when an nMOS transistor is under positive bias. These both effects degrade the transistor speed and system may fail due to timing violations. In this paper, an Adaptive Hold Logic (AHL) circuit is proposed to mitigate the performance degradation due to aging effects.

References
  1. I. C. Lin, Y. H. Cho and Y. M. Yang, "Aging Aware Reliable Multiplier Design With Adaptive Hold Logic", IEEE Transaction on Very Large Scale Integration (VLSI) System, 2014.
  2. E. Maricau and G. Gielen. 2013 Analog IC Reliability in Nanometer CMOS. Springer Science Business Media, New York.
  3. Calimera, E. Macii and M. Poncino. 2012 "Design techniques for NBTI tolerant power-gating architecture", IEEE Transaction on Circuits System, vol. 59, no. 4, pp. 249–253.
  4. Y. Lee and T. Kim. 2011 "A fine-grained technique of NBTI-aware voltage scaling and body biasing for standard cell based designs", in Proceeding of Asia South Pacific Design Automation Conference, pp. 603–608.
  5. M. Basoglu, M. Orshansky and M. Erez. 2010 "NBTI-aware DVFS: A new approach to saving energy and increasing processor lifetime", in Proceeding of ACM/IEEE International Symposium on Low Power Electronics and Design, 253–258.
  6. K. C. Wu and D. Marculescu. 2009 "Joint logic restructuring and pin reordering against NBTI-induced performance degradation", in Proceedings of Design, Automation and Test in Europe, 5–80.
  7. S. V. Kumar, C. H. Kim and S. S. Sapatnekar 2007 "NBTI-aware synthesis of digital circuits", in Proceedings of ACM/IEEE Design Automation Conference, 370–375.
  8. R. Vattikonda, W. Wang and Y. Cao. 2004 "Modelling and minimization of pMOS NBTI effect for robust nanometer design", in Proceedings of ACM/IEEE Design Automation Conference, 1047–1052.
  9. N. Weste and Kamaran "Principles of CMOS VLSI Design", Education Asia.
  10. S. Khan, H. Kukner, P. Raghavan and F. Catthoor, "BTI Impact on Logical Gates in Nano-scale CMOS Technology".
Index Terms

Computer Science
Information Sciences

Keywords

Aging Effects Aging Indicator Bias Temperature Instability.