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Reseach Article

Performance Analysis of Graded Channel Double-Gate MOSFET in Nano-Regime using TCAD Simulation

Published on February 2017 by Aakanksha Lakhanpal, Shashi B. Rana, Ashwani K. Rana
National Conference on Latest Initiatives and Innovations in Communication and Electronics
Foundation of Computer Science USA
IICE2016 - Number 1
February 2017
Authors: Aakanksha Lakhanpal, Shashi B. Rana, Ashwani K. Rana
458f1ac6-0638-4008-8f20-772393b52538

Aakanksha Lakhanpal, Shashi B. Rana, Ashwani K. Rana . Performance Analysis of Graded Channel Double-Gate MOSFET in Nano-Regime using TCAD Simulation. National Conference on Latest Initiatives and Innovations in Communication and Electronics. IICE2016, 1 (February 2017), 1-4.

@article{
author = { Aakanksha Lakhanpal, Shashi B. Rana, Ashwani K. Rana },
title = { Performance Analysis of Graded Channel Double-Gate MOSFET in Nano-Regime using TCAD Simulation },
journal = { National Conference on Latest Initiatives and Innovations in Communication and Electronics },
issue_date = { February 2017 },
volume = { IICE2016 },
number = { 1 },
month = { February },
year = { 2017 },
issn = 0975-8887,
pages = { 1-4 },
numpages = 4,
url = { /proceedings/iice2016/number1/26946-1650/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 National Conference on Latest Initiatives and Innovations in Communication and Electronics
%A Aakanksha Lakhanpal
%A Shashi B. Rana
%A Ashwani K. Rana
%T Performance Analysis of Graded Channel Double-Gate MOSFET in Nano-Regime using TCAD Simulation
%J National Conference on Latest Initiatives and Innovations in Communication and Electronics
%@ 0975-8887
%V IICE2016
%N 1
%P 1-4
%D 2017
%I International Journal of Computer Applications
Abstract

Double -gate (DG) MOSFET has emerged as one of the most promising architecture for scaling CMOS devices down to nanometer size as compared to the planar single-gate MOSFETs. In this work, the impact of channel engineering on double gate MOSFET has been investigated. Further, the comparison of double-gate MOSFETs with the graded channel double-gate MOSFETs has been done in terms of performance parameters such as I-V characteristics, electric field, electron current density, space charge density using TCAD Simulator.

References
  1. G. Moore "Cramming more components onto integrated circuits" Electronics 38,114(1965).
  2. D. G. Borse, K. N. M. Rani , N. K Jha, A. N Chandorkar, J. Vasi, V. R. Rao , B. Cheng, and J. C. S. Woo, " Optimization and realization of sub- 100nm channel length single halo p MOSFETs" IEEE Trans. Electron Devices ,vol. 49, no. 6, pp. 1077-1079, Jun. 2002.
  3. G. Nicholas, T. J. Grasby, E. H. C Parker, T. E. Whall, and T. Skotnicki, "Evidence of reduced self-heating in strained Si MOSFETs," IEEE Electron Device Lett. , vol. 26, no. 9, pp. 684-686, Sep. 2005.
  4. M. Ieong, H. S. P. Wong, E. Nowak, J. Kedzierski and E. C. Jones, "High performance double-gate device technology challenges and opportunities" Proc. Int. Symp. On Quality Electronic Design, pp. 492- 495, 2002.
  5. M. A. Pavanello, J. A. Martino,V. Dessard, D. Flandre, "Analog performance and application of graded-channel fully depleted SOI MOSFETs," Solid State Electron, vol. 44, no. 7, pp. 1219-1222, Jul. 2000.
  6. M. A. Pavanello, J. A. Martino, D. Flandre, "Graded-channel fully depleted silicon-on-insulator n-MOSFET for reducing the parasitic bipolar effects," Solid-State Electron, vol. 44, no. 7, pp. 917-922, Jun. 2000.
  7. M. A. Pavanello, J. A. Martino, J. P Raskin, D. Flandre, "High performance analog operation of double gate transistors with the graded- channel architecture at low temperatures," Solid-State Electron, vol. 49, no. 10, pp. 1569-1575, Oct. 2005.
  8. I. D. Mayergoyz, "Solution of the non-linear Poisson equation of semiconductor device theory," J. Appl. Phys. , 59, pp. 195-199, 1986.
  9. E. Contreras, A. Cerdeira, M. A. Pavanello, "Application of the symmteric doped double-gate model in circuit simulation containing double-gate graded-channel transistors," Solid-State Electronics, vol. 52, pp. 830-837, 2008.
  10. "Sentaurus Device User Guide", Version A-2008. 09, September 2008, Synopsys International.
  11. ISE TCAD:Synopsys Sentaurus Device simulator.
  12. R. K. Sharma, Mridul Gupta, "TCAD assessment of device design technologies for enhanced performance of nanoscale DG-MOSFET," IEEE Trans. on Electron Devices, vol. 58, no. 9, Sept. 2011.
  13. J. Lyu, B. G. Park, K. Chun, J. D. Lee, "Reduction of hot-carrier generation in 0. 1um recessed channel n-MOSFET with laterally graded channel doping," IEEE Trans. Electronic Devices Lett. , vol. 18, no. 11, pp. 1962-1967, Nov. 2002.
Index Terms

Computer Science
Information Sciences

Keywords

Dg-mosfet Mosfet Scaling Very Large Scale Integration (vlsi) Sces Graded Channel (gc)