CFP last date
20 December 2024
Reseach Article

GaAs, InP, InGaAs, GaInP, p+-i-n+ Multiplication Measurements For Modeling of Semiconductor as Photo Detectors

Published on April 2013 by Sanjay C. Patil, B. K. Mishra
International Conference and Workshop on Emerging Trends in Technology 2013
Foundation of Computer Science USA
ICWET2013 - Number 3
April 2013
Authors: Sanjay C. Patil, B. K. Mishra
5e103336-c1ed-45c6-bbef-56413507137c

Sanjay C. Patil, B. K. Mishra . GaAs, InP, InGaAs, GaInP, p+-i-n+ Multiplication Measurements For Modeling of Semiconductor as Photo Detectors. International Conference and Workshop on Emerging Trends in Technology 2013. ICWET2013, 3 (April 2013), 5-14.

@article{
author = { Sanjay C. Patil, B. K. Mishra },
title = { GaAs, InP, InGaAs, GaInP, p+-i-n+ Multiplication Measurements For Modeling of Semiconductor as Photo Detectors },
journal = { International Conference and Workshop on Emerging Trends in Technology 2013 },
issue_date = { April 2013 },
volume = { ICWET2013 },
number = { 3 },
month = { April },
year = { 2013 },
issn = 0975-8887,
pages = { 5-14 },
numpages = 10,
url = { /proceedings/icwet2013/number3/11343-1361/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 International Conference and Workshop on Emerging Trends in Technology 2013
%A Sanjay C. Patil
%A B. K. Mishra
%T GaAs, InP, InGaAs, GaInP, p+-i-n+ Multiplication Measurements For Modeling of Semiconductor as Photo Detectors
%J International Conference and Workshop on Emerging Trends in Technology 2013
%@ 0975-8887
%V ICWET2013
%N 3
%P 5-14
%D 2013
%I International Journal of Computer Applications
Abstract

Optoelectronic is one of the thrust areas for the recent research activity. One of the key components of the optoelectronic family is photo detector to be widely used in broadband communication, optical computing, optical transformer, optical control etc. Present paper includes the investigation. carried on the basis of the. Multiplication measurements on GaAs, InP, InGaAs, GaInP, p+-i-n+s with –region thicknesses, with investigation of applicability of the local ionization theory. A local ionization coefficient to be increasingly unrepresentative of the position dependent values in the device as is reduced below 1 um. The success of the local model in predicting multiplication is therefore attributed to the dead-space information already being contained within the experimentally determined values of local coefficients. This suggested that these should therefore be thought of as effective coefficients, which, despite the presence of dead-space effects, can be, still be used with the existing local theory for efficiently quantifying multiplication and breakdown voltages.

References
  1. B. K. Mishra,computerAidedmodelingof solidstate photodetectors Ph. DthesisBirlainstituteoftechnology,Mesra,Ranchi 1995
  2. T. P. Pearsall, "Impact ionization rates for electrons and holes in Ga0. 47In 0. 53As," Appl. Phys. Lett. 36, 218-220 (1980)
  3. S. Wang, R. Sidhu, X. G. Zheng, X. Li, X. Sun, A. L. Holmes, Jr. , and J. C. Campbell, IEEE Photonics Technol. Lett. 13, 1346 (2001).
  4. B. K. Mishra, LochanJolly, S. C. Patil," In1-xGaxAs a next generation material for photodetectors ",JSAM. 2011
  5. R. Poerschke,Shpringer–Verlag,Madelung,O. (ed. ),Semiconductor: group IV elements and III-V compound. Series "Data in science and technology, Berlin, 164 (1991).
  6. J. R. Chelikowsky, and M. L. Cohen, Phys. Rev. B14, 556 (1976).
  7. R. J. McIntyre, "A New Look at Impact Ionization – Part I: A Theory of Gain, Noise, Breakdown Probability, and Frequency Response," IEEE Trans. Electron Devices, vol. 46, 1623—1631 (1999).
  8. R. B. Emmons, J. Appl. Phys. 38, 3705 (1967).
  9. H. Ando and H. Kanbe, "Ionization coefficient measurement in GaAs by using multiplication noise characteristics," Solid-State Electron. , vol. 24pp. 629–634, 1981.
  10. O. Konstantinov, Q. Wahab, N. Nordell, and U. Lindefelt, "Ionization rates and critical fields in 4H silicon carbide," Appl. Phys. Lett. , vol. 71, July 1997
  11. Y. Okuto and C. R. Crowell, "Ionization coefficients in semiconductors," Phys. Rev. B. , vol. 10, pp. 4284–4296, Nov. 1973.
  12. G. E. Bulman, V. M. Robbins, and G. E. Stillman, "The determination of impact ionization coefficients in (100) gallium aresenide using avalanche noise and photocurrent multiplication measurements," IEEE Trans. Electron Devices, vol. ED-32, pp. 2454–2466, Nov. 1985.
  13. M. M. Hayat, B. E. A. Saleh, and M. C. Teich, "Effect of dead space on gain and noise of double-carrier-multiplication avalanche photodiodes," IEEE Trans. Electron Devices, vol. 39, pp. 546–552, Mar. 1992.
  14. M. M. Hayat, W. L. Sargeant, and B. E. A. Saleh, "Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes," IEEE J. Quantum Electron, vol. 28, pp. 1360–1365, May 1992.
  15. A. Di Carlo and P. Lugli, "Dead-space effects under near breakdown conditions in AlGaAs/GaAs HBT's," IEEE Electron Device Lett. , vol. 14, pp. 103–105, Mar. 1993.
  16. S. P. Wilson, S. Brand, and R. A. Abram, "Avalanche multiplication properties of GaAs calculated from spatially transient ionization coefficients," Solid-State Electron. , vol. 38, pp. 2095–2100, Nov. 1995.
  17. A. Di Carlo and P. Lugli, "Dead-space effects under near breakdown conditions in AlGaAs/GaAs HBT's," IEEE Electron Device Lett. , vol. 14, pp. 103–105, Mar. 1993.
  18. S. P. Wilson, S. Brand, and R. A. Abram, "Avalanche multiplication properties of GaAs calculated from spatially transient ionization coefficients," Solid-State Electron. , vol. 38, pp. 2095–2100, Nov. 1995.
  19. IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 10, OCTOBER 2003 2027 Temperature Dependence of Impact Ionization in GaAs C. Groves, R. Ghin, J. P. R. David, and G. J. Rees
  20. IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 10, OCTOBER 2003 2021 Temperature Dependence of Breakdown and Avalanche Multiplication in In0:53Ga0:47As Diodes and Heterojunction Bipolar Transistors M. Yee, W. K. Ng, J. P. R. David, Senior Member, IEEE, P. A. Houston, C. H. Tan, and A. Krysa
  21. Shanghai Institute of Technical Physics Theory Study of SAGCM InP L. Lin, W. J. Wang, N. Li, X. S. Chen and W. Lu Shanghai Institute of Technical Physics, Chinese Academy of Sciences National Lab for Infrared Physics,
  22. Impact ionization coefficients in (100) GaInP S. -L. Fu, T. P. Chin, M. C. Ho, C. W. Tu, and P. M. Asbeck Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093
Index Terms

Computer Science
Information Sciences

Keywords

Photo Detectors Impact Ionization