Integrated Circuits operating under radiation may be affected by undesirable effects caused by charged particles located in the space environment. Soft errors, especially those produced in harsh environments (as for example radiation), are a major concern for digital circuits. When a particle hits the silicon, it loses its energy and transmits it to the silicon, causing a current burst. In the case of Single Event Upsets (SEUs), these can randomly change the content of storage cells. To protect storage cells of integrated circuits from this phenomenon is by designing circuits that able to detect an SEU event and act accordingly to prevent error propagation and guarantee full reliability in the system. Those based on redundancy, as Triple Modular Redundancy (TMR) and Hamming Codes, are especially popular, since they are quite straightforward to implement. We present new approach using single Hamming encoder and common decoder to protect storage cells present in the IIR filter from this type of Single Event Upsets (SEU). This design is coded using VHDL language and synthesized using Xilinx ISE. The design is compared with shared hamming encoder and decoder design. The implementation result shows that the gate occupancy of proposed design is better compared to conventional protection technique.

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Digital filters hamming codes reliability single Event Upset (SEU)