CFP last date
20 December 2024
Reseach Article

Design Of High Performance PLL Using Process, Temperature Compensated VCO

Published on None 2011 by K.A.Jyotsna, D.Anitha
International Conference on VLSI, Communication & Instrumentation
Foundation of Computer Science USA
ICVCI - Number 11
None 2011
Authors: K.A.Jyotsna, D.Anitha
1fc9fbfe-6f6d-48a4-a993-a3650fb9423e

K.A.Jyotsna, D.Anitha . Design Of High Performance PLL Using Process, Temperature Compensated VCO. International Conference on VLSI, Communication & Instrumentation. ICVCI, 11 (None 2011), 15-19.

@article{
author = { K.A.Jyotsna, D.Anitha },
title = { Design Of High Performance PLL Using Process, Temperature Compensated VCO },
journal = { International Conference on VLSI, Communication & Instrumentation },
issue_date = { None 2011 },
volume = { ICVCI },
number = { 11 },
month = { None },
year = { 2011 },
issn = 0975-8887,
pages = { 15-19 },
numpages = 5,
url = { /proceedings/icvci/number11/2709-1436/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 International Conference on VLSI, Communication & Instrumentation
%A K.A.Jyotsna
%A D.Anitha
%T Design Of High Performance PLL Using Process, Temperature Compensated VCO
%J International Conference on VLSI, Communication & Instrumentation
%@ 0975-8887
%V ICVCI
%N 11
%P 15-19
%D 2011
%I International Journal of Computer Applications
Abstract

In this paper the Design and Verification of High performance PLL is presented and implemented at 180nm CMOS Process Technology. Process and Temperature Compensation Techniques for minimizing the variation of the free-running frequency of Voltage Controlled Oscillator are discussed. Matched up and down currents Charge Pump is designed. 2 types of PFDs are presented with their consequences. Type 1 PFD is designed with more area and zero dead zone which is compared with type 2 PFD which is designed with less area but 0.01n sec dead zone. The PLL is operated at 1.25GHz with power supply of 1.8V.

References
  1. Kadaba R. Lakshmikumar , “Analog PLL Design With Ring Oscillators at Low –Gigahertz Frequencies in Nanometer CMOS: Challenges and Solutions” IEEE Circuits and Systems-II,vol 56,no 5,pp 389-393, May 2009.
  2. Chu-Lung Hsu,Yiting Lai, Shu-Wei Wang ,“Built –in-Self – Test for Phase Locked Loops,” IEEE Instumentation & Measurement, vol 54,no 3, pp996-1002, June 2005.
  3. Won Hyo LEE, Sung Dae LEE, Jun-Dung CHO,”A High Speed , Low Power Phase Frequency Detector and Charge Pump circuits for High Frequency Phase Locked Loops” IEICE Trans Fundamentals , vol E82-A, no 11, pp 2514-2519, November 1999.
  4. A. Hajimiri, S. Limotyrakis, and T. Lee, “Jitter and phase noise in ring oscillators,” IEEE J. Solid-State Circuits, vol. 34, no. 6, pp. 790–804,Jun. 1999.
  5. Miranda J. Ha, “A Low-Power, High-Bandwidth LDO Voltage Regulator with No External Capacitor”, S.B. EE, M.I.T., 2007
  6. K. Lakshmikumar, V. Mukundagiri, and S. Gierkink, “A process and temperature Compensated two-stage ring oscillator,” in IEEE Custom Integr.Circuits Conf., Sep. 2007, pp. 691–694.
  7. B. Razavi, Design of Analog CMOS Integrated Circuits McGraw-Hill, 2001.
  8. Kiat-Seng Yeo, Samir S . Rofail, Wang –Ling Goh , CMOS/ BiCMOS ULSI Low Voltage, Low Power Pearson Education, 2002.
Index Terms

Computer Science
Information Sciences

Keywords

charge pump loop filter process voltage temperature (PVT) ring oscillator voltage controlled oscillator