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Comparative Power Analysis of LFSR Test Pattern Generators

by H. Srikanth Kamath, Aakash Nath, Shobhit Kumar Srivastava, Saket Garg
journal cover thumbnail

International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 98 - Number 8
Year of Publication: 2014
Authors: H. Srikanth Kamath, Aakash Nath, Shobhit Kumar Srivastava, Saket Garg
10.5120/17207-7426

H. Srikanth Kamath, Aakash Nath, Shobhit Kumar Srivastava, Saket Garg . Comparative Power Analysis of LFSR Test Pattern Generators. International Journal of Computer Applications. 98, 8 ( July 2014), 37-39. DOI=10.5120/17207-7426

@article{ 10.5120/17207-7426,
author = { H. Srikanth Kamath, Aakash Nath, Shobhit Kumar Srivastava, Saket Garg },
title = { Comparative Power Analysis of LFSR Test Pattern Generators },
journal = { International Journal of Computer Applications },
issue_date = { July 2014 },
volume = { 98 },
number = { 8 },
month = { July },
year = { 2014 },
issn = { 0975-8887 },
pages = { 37-39 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume98/number8/17207-7426/ },
doi = { 10.5120/17207-7426 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T22:25:43.083097+05:30
%A H. Srikanth Kamath
%A Aakash Nath
%A Shobhit Kumar Srivastava
%A Saket Garg
%T Comparative Power Analysis of LFSR Test Pattern Generators
%J International Journal of Computer Applications
%@ 0975-8887
%V 98
%N 8
%P 37-39
%D 2014
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Automatic Test Pattern Generation Automatic Test Pattern Generator is an electronic de-sign automation method used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The designs selected for comparison use LFSR as its core central component around which the entire algorithms are based which contribute in construction of Automatic test pattern generator. The LFSR is considered as it gives excellent random characteristics and has a low area overhead which allows it to be placed in the integrated circuit.

References
  1. BO YE and Tian-Wang Li," A novel BIST scheme for low power testing," 2010 IEEE.
  2. P. Girard," survey of low-power testing of VLSI circuits," IEEE design and test of computers, Vol. 19,no. 3,PP 80-90,May-June 2002.
  3. S. Wang and S. K. Gupta," DS-LFSR: a BIST TPG for low switching activity," IEEE Trans computer-aided design of Integrated circuits and systems, Vol. 21, No. 7,pp. 842-851, July 2002.
  4. Low power, Low Transition random pattern generator. 2012
  5. Mark Goresky and Andrew M Klapper, "Fibonacci and Galois Representations of Feedback with Carry Shift Registers", IEEE, Vol. 48, No. 11, November 2002.
  6. J Bhasker,"A VHDL Primer", Prentice Hall,3rd Edition,8120323661
  7. H Roth, Lizzy Kurian John, Digital System Design Using VHDL 2nd Edition.
Index Terms

Computer Science
Information Sciences

Keywords

LFSR random pattern low power four bits

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