International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 89 - Number 15 |
Year of Publication: 2014 |
Authors: Anchal Sharma, Charu Madhu, Jatinder Singh |
10.5120/15710-4603 |
Anchal Sharma, Charu Madhu, Jatinder Singh . Performance Evaluation of Thin Film Transistors: History, Technology Development and Comparison: A Review. International Journal of Computer Applications. 89, 15 ( March 2014), 36-40. DOI=10.5120/15710-4603
In the past several years, the thin film transistor technology has progressed intensely, especially in the low temperature, large-area, high throughput fabrication process. Recently, various thin film transistors (TFT) technological sources have been realized, indicating that new information appliances that match new information infrastructures and lifestyles will be available in the future. In this paper, we review different types of TFTs, including amorphous silicon, polysilicon, organic and oxide TFTs. We report here on different techniques e. g. fabrication and simulation based which has been developed to accurately simulate TFT characteristics and to improve the understanding of the device operation. Here, we highlight the problem gap in the TFT technology that includes downscaling of TFTs and stability of p-type zinc oxide (ZnO) TFTs and ways to improve it.