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Reliability Study of Single Stage Multi-Input Majority Function for QCA

by Esam Alkaldy, Keivan Navi
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International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 83 - Number 2
Year of Publication: 2013
Authors: Esam Alkaldy, Keivan Navi
10.5120/14420-2545

Esam Alkaldy, Keivan Navi . Reliability Study of Single Stage Multi-Input Majority Function for QCA. International Journal of Computer Applications. 83, 2 ( December 2013), 19-23. DOI=10.5120/14420-2545

@article{ 10.5120/14420-2545,
author = { Esam Alkaldy, Keivan Navi },
title = { Reliability Study of Single Stage Multi-Input Majority Function for QCA },
journal = { International Journal of Computer Applications },
issue_date = { December 2013 },
volume = { 83 },
number = { 2 },
month = { December },
year = { 2013 },
issn = { 0975-8887 },
pages = { 19-23 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume83/number2/14420-2545/ },
doi = { 10.5120/14420-2545 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:58:20.794818+05:30
%A Esam Alkaldy
%A Keivan Navi
%T Reliability Study of Single Stage Multi-Input Majority Function for QCA
%J International Journal of Computer Applications
%@ 0975-8887
%V 83
%N 2
%P 19-23
%D 2013
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Due to the physical limitations faced by CMOS (Complementary Metal Oxide Semiconductor) scaling many technologies were suggested to replace CMOS on the nanoscale. Most of the suggested technologies are not deterministic and follow the Law of Large Number LLN. So, the reliability inspection is essential to these technologies. In this paper the PTM (Probabilistic Transfer Matrix) is used to inspect the reliability of multi-input majority function for QCA (Quantum dot-Cellular Automata). This study conclude that the single-gate with multi-input Majority has the same reliability of its 3-input form. To extend the results to digital circuits, the full adder is used as a test bench. The results show the superiority of the full adder version designed with 5-input majority gate upon other designs from reliability point of view.

References
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  8. Walid Ibrahim, Valeriu Beiu, and Mawahib Hussein Sulieman, "On the Reliability of Majority Gates Full Adders" , IEEE Transactions On Nanotechnology, vol. 7, no. 1, january 2008
Index Terms

Computer Science
Information Sciences

Keywords

Reliability of majority gate QCA full adder

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