We apologize for a recent technical issue with our email system, which temporarily affected account activations. Accounts have now been activated. Authors may proceed with paper submissions. PhDFocusTM
CFP last date
20 November 2024
Reseach Article

Article:Defect Analysis and Prevention for Software Process Quality Improvement

by Sakthi Kumaresh, R Baskaran
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 8 - Number 7
Year of Publication: 2010
Authors: Sakthi Kumaresh, R Baskaran
10.5120/1218-1759

Sakthi Kumaresh, R Baskaran . Article:Defect Analysis and Prevention for Software Process Quality Improvement. International Journal of Computer Applications. 8, 7 ( October 2010), 42-47. DOI=10.5120/1218-1759

@article{ 10.5120/1218-1759,
author = { Sakthi Kumaresh, R Baskaran },
title = { Article:Defect Analysis and Prevention for Software Process Quality Improvement },
journal = { International Journal of Computer Applications },
issue_date = { October 2010 },
volume = { 8 },
number = { 7 },
month = { October },
year = { 2010 },
issn = { 0975-8887 },
pages = { 42-47 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume8/number7/1218-1759/ },
doi = { 10.5120/1218-1759 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T19:56:51.710765+05:30
%A Sakthi Kumaresh
%A R Baskaran
%T Article:Defect Analysis and Prevention for Software Process Quality Improvement
%J International Journal of Computer Applications
%@ 0975-8887
%V 8
%N 7
%P 42-47
%D 2010
%I Foundation of Computer Science (FCS), NY, USA
Abstract

"An ounce of prevention is worth a pound of cure." In software, these expressions translate into the common observation that the longer a defect stays in process, the more expensive it is to fix [10]. Moreover software defects are expensive and time consuming. The cost of finding and correcting defects represents one of the most expensive software development activities. And that too, if the errors get carried away till the final acceptance testing stage of the project life cycle, then the project is at a greater risk in terms of its Time and Cost factors. A small amount of effort spent on quality assurance will see good amount of cost savings in terms of detecting and eliminating the defects.

References
  1. Ajit Ashok Shenvi,2009,”Defect Prevention with Orthogonal Defect Classification”, In Proc- ISEC ’09, February 23-26, 2009
  2. Defect Prevention by SEI’s CMM Model Version 1.1., http://www.dfs.mil/technology/pal/cmm/vl/dp
  3. Linda Westfall, Defect Density http://www.westfallteam.com/Papers/defect_density.pdf
  4. Megan Graham, 2005, Software Defect Prevention using Orthogonal Defect Prevention. http://twin-spin.cs.umn.edufiles/ODC_TwinSPIN
  5. Mukesh soni, 1997, Defect Prevention: Reducing cost and improving quality” published in IEEE Computer, (Volume 30, Issue 8), August 1997.
  6. Pan Tiejun, Zheng Leina, Fang Chengbin, 2008, “Defect Tracing System Based on Orthogonal Defect Classification” published in Computer Engineering and Applications, vol 43, PP 9-10, May 2008.
  7. Pankaj Jalote, Naresh Agarwal, 2007, “Using Defect Analysis Feedback for Improving Quality and Productivity in Iterative Software Development” In proc- ITI 3rd International Conference on Information and Communications Technology, pp. 703-713.
  8. Ram Chillarege, Inderpal S Bhandari, Jarir K Chaar, Michael J Halliday, Diane S Moebus, Bonnie K Ray, Man-Yuen Wong, 1992, “Orthogonal Defect Classification - A Concept for In-Process Measurements”, IEEE Transactions on Software Engineering, Vol. 18, No.11, Nov 1992. http://www.chillarege.com/odc/articles/odcconcept/odc.html
  9. Stefan Wagner, 2008,”Defect Classification and Defect Type Revisited” Proceedings of the 2008 workshop on Defects in large software systems, (DEFECTS’08) pages 73-83, ACM Press,2008
  10. Steve McConnel, “An ounce of prevention”, IEEE software, May/June 2001
  11. Suma V and T R Gopalakrishnan Nair , 2008, “ Effective Defect Prevention Approach in Software Process for Achieving Better Quality Levels” Proceedings of World Academy of Science, Engineering and Technology Volume 32 August 2008
Index Terms

Computer Science
Information Sciences

Keywords

Defect Defect Analysis Defect Prevention Root Cause Analysis