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Detection of Defect Potentials using Peer Reviews: An Agile Approach

by Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma
journal cover thumbnail

International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 76 - Number 11
Year of Publication: 2013
Authors: Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma
10.5120/13294-0872

Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma . Detection of Defect Potentials using Peer Reviews: An Agile Approach. International Journal of Computer Applications. 76, 11 ( August 2013), 42-46. DOI=10.5120/13294-0872

@article{ 10.5120/13294-0872,
author = { Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma },
title = { Detection of Defect Potentials using Peer Reviews: An Agile Approach },
journal = { International Journal of Computer Applications },
issue_date = { August 2013 },
volume = { 76 },
number = { 11 },
month = { August },
year = { 2013 },
issn = { 0975-8887 },
pages = { 42-46 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume76/number11/13294-0872/ },
doi = { 10.5120/13294-0872 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:45:39.725254+05:30
%A Chandravardhan Singh Raghaw
%A Prakriti Trivedi
%A Vipul Sharma
%T Detection of Defect Potentials using Peer Reviews: An Agile Approach
%J International Journal of Computer Applications
%@ 0975-8887
%V 76
%N 11
%P 42-46
%D 2013
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Maintain quality is always an important issue for the software end product. This paper includes how to improve quality of product by detecting possible number of defects potentials. The authors are using an approach called Peer Review for detection of defect potential. In this paper peer review is done using an agile approach. A study has been conducted on three final year projects and includes the detection of maximum number of defect potentials using different peer review techniques. Finally, as a result, total numbers of defects with different review techniques are compared with possible defects.

References
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Index Terms

Computer Science
Information Sciences

Keywords

Defect Potential Peer Review Agile Approach

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