International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 76 - Number 11 |
Year of Publication: 2013 |
Authors: Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma |
10.5120/13294-0872 |
Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma . Detection of Defect Potentials using Peer Reviews: An Agile Approach. International Journal of Computer Applications. 76, 11 ( August 2013), 42-46. DOI=10.5120/13294-0872
Maintain quality is always an important issue for the software end product. This paper includes how to improve quality of product by detecting possible number of defects potentials. The authors are using an approach called Peer Review for detection of defect potential. In this paper peer review is done using an agile approach. A study has been conducted on three final year projects and includes the detection of maximum number of defect potentials using different peer review techniques. Finally, as a result, total numbers of defects with different review techniques are compared with possible defects.