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Surface Study of ZnO Thin Film using Image Processing Techniques

by G. R. Kandhasamy, S. Muruganand, M. Pavithra
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International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 70 - Number 23
Year of Publication: 2013
Authors: G. R. Kandhasamy, S. Muruganand, M. Pavithra
10.5120/12208-8175

G. R. Kandhasamy, S. Muruganand, M. Pavithra . Surface Study of ZnO Thin Film using Image Processing Techniques. International Journal of Computer Applications. 70, 23 ( May 2013), 26-28. DOI=10.5120/12208-8175

@article{ 10.5120/12208-8175,
author = { G. R. Kandhasamy, S. Muruganand, M. Pavithra },
title = { Surface Study of ZnO Thin Film using Image Processing Techniques },
journal = { International Journal of Computer Applications },
issue_date = { May 2013 },
volume = { 70 },
number = { 23 },
month = { May },
year = { 2013 },
issn = { 0975-8887 },
pages = { 26-28 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume70/number23/12208-8175/ },
doi = { 10.5120/12208-8175 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:34:09.335728+05:30
%A G. R. Kandhasamy
%A S. Muruganand
%A M. Pavithra
%T Surface Study of ZnO Thin Film using Image Processing Techniques
%J International Journal of Computer Applications
%@ 0975-8887
%V 70
%N 23
%P 26-28
%D 2013
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Surface study of thin film is characterized by employing scanning Electron microscopy (SEM). The implementation of image processing algorithm is to determine the pores in the SEM images of thin film. Image segmentation is applied to detect the pores in the thin film. In this paper, ZnO thin film is used for the surface study by various edge detection techniques. As the result canny edge detection gives the best porosity information of ZnO thin film SEM images. This result is taken by performing the statistical analysis (ie) finding the PSNR (Peak Signal to Noise Ratio) values . This may help to identify the particular place of pores and pits in thin film SEM images.

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Index Terms

Computer Science
Information Sciences

Keywords

Thin films SEM images Image processing Segmentation PSNR values canny edge detection

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