We apologize for a recent technical issue with our email system, which temporarily affected account activations. Accounts have now been activated. Authors may proceed with paper submissions. PhDFocusTM
CFP last date
20 November 2024
Reseach Article

Posterior Analysis of Sequential Normal Testing Procedure

by Birjesh Kumar, Abha Chandra, K. K. Sharma
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 70 - Number 17
Year of Publication: 2013
Authors: Birjesh Kumar, Abha Chandra, K. K. Sharma
10.5120/12156-7668

Birjesh Kumar, Abha Chandra, K. K. Sharma . Posterior Analysis of Sequential Normal Testing Procedure. International Journal of Computer Applications. 70, 17 ( May 2013), 1-8. DOI=10.5120/12156-7668

@article{ 10.5120/12156-7668,
author = { Birjesh Kumar, Abha Chandra, K. K. Sharma },
title = { Posterior Analysis of Sequential Normal Testing Procedure },
journal = { International Journal of Computer Applications },
issue_date = { May 2013 },
volume = { 70 },
number = { 17 },
month = { May },
year = { 2013 },
issn = { 0975-8887 },
pages = { 1-8 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume70/number17/12156-7668/ },
doi = { 10.5120/12156-7668 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:33:05.217389+05:30
%A Birjesh Kumar
%A Abha Chandra
%A K. K. Sharma
%T Posterior Analysis of Sequential Normal Testing Procedure
%J International Journal of Computer Applications
%@ 0975-8887
%V 70
%N 17
%P 1-8
%D 2013
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Several studies deals with the non- robust character of various types of acceptance plans. Many such studies also analyze the robust character of sequential testing procedures when the underlying failure time distribution has a monotone failure rate. A vast literature on the life testing plans in the Bayesian framework is also available where updating prior with experimental data has been the main concern. Highlighting the point that the basic normal lifetime distribution can also be updated in respect of prior variations in the involve parameters. The present study deals with the analysis of the robust character of sequential normal testing procedures when the mean of the basic normal distribution is considered as a random variable. The robust character of the consistency of the random variable n, in view of prior variations, is also analyzed

References
  1. Wald, A. (1947), " sequential analysis" , John Wily and sons, New York, USA.
  2. Montage, E. R. and Singpurwalla, N. D. (1985), "Robustness of sequential exponential life testing procedures", JASA,80,715-719.
  3. Sharma K. K. and Rana, R. S. (1990), "Robustness of sequential Gamma life testing procedure", Micro electron Reliab. , Vol. 30 (6),1145-1153.
  4. Sharma K. K. and Rana,R. S. (1991), "Robustness of sequential Gamma life testing procedure in respect of expected failure times", Micro electron Reliab. , Vol. 31(6), 1073-1076.
  5. Sharma K. K. Singh B. and Goel J. (2009)," Sensitivity Analysis of Sequential Normal Testing Procedure. "J. Stat. & Appl. Vol. 4, No. 1, 45-57.
  6. Bazovsky, I. (1961), "Reliability theory and practice", Practice Hall, New Jersey.
  7. Box, G. E. P. and Tiao(1973),"Bayesian inference in statistical analysis".
  8. Davis D. J. (1952), "The analysis of some failure data", J. Amer. Statist. Assoc. ,47, 113-150.
  9. Fryer and Holt(1970), "On the robustness of the standard estimate of the exponential mean to contamination", Biometric, 57, 641-648.
  10. Fryer and Holt(1976),"On the robustness of the power function of the one sample test for the negative exponential distribution", Commun. Statistics, A5, 723-734.
  11. Harter, L. and Moore, A. H. (1976), "An evaluation of exponential and Weibull test plans", IEEE transactions on Reliability, 25, 100-104.
  12. James E. Hall(1979), "Minimum Variance and VOQL Sampling Plan", Techno metrics, Vol. 21, No. 4, 555-565.
  13. Johnson, N. L. , and Kortz, S. (1969): Discrete Distributions, John Wiley and Sons, New York.
  14. Martz, H. F. and Waller, R. A. (1982), "Bayesian Reliability Analysis", John Wiley and Sons, New York, USA.
  15. Zellen and Dannemiller(1961), "The Robustness of the life testing procedure derived from the exponential distribution" , Techno metrics, 3, 29-49.
Index Terms

Computer Science
Information Sciences

Keywords

Robustness SNTP OC ASN and Coefficient of variation function(C. V)