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Reseach Article

Article:Standby Leakage Reduction in Nanoscale CMOS VLSI Circuits

by Dhananjay E. Upasani, Sandip B. Shrote, Pallavi S.Deshpande
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 7 - Number 5
Year of Publication: 2010
Authors: Dhananjay E. Upasani, Sandip B. Shrote, Pallavi S.Deshpande
10.5120/1162-1467

Dhananjay E. Upasani, Sandip B. Shrote, Pallavi S.Deshpande . Article:Standby Leakage Reduction in Nanoscale CMOS VLSI Circuits. International Journal of Computer Applications. 7, 5 ( September 2010), 1-4. DOI=10.5120/1162-1467

@article{ 10.5120/1162-1467,
author = { Dhananjay E. Upasani, Sandip B. Shrote, Pallavi S.Deshpande },
title = { Article:Standby Leakage Reduction in Nanoscale CMOS VLSI Circuits },
journal = { International Journal of Computer Applications },
issue_date = { September 2010 },
volume = { 7 },
number = { 5 },
month = { September },
year = { 2010 },
issn = { 0975-8887 },
pages = { 1-4 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume7/number5/1162-1467/ },
doi = { 10.5120/1162-1467 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T19:55:34.149918+05:30
%A Dhananjay E. Upasani
%A Sandip B. Shrote
%A Pallavi S.Deshpande
%T Article:Standby Leakage Reduction in Nanoscale CMOS VLSI Circuits
%J International Journal of Computer Applications
%@ 0975-8887
%V 7
%N 5
%P 1-4
%D 2010
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Most of the portable systems, such as cellular communication devices, and laptop computers operate from a limited power supply. Devices like cell phones have long idle times and operate in standby mode when not in use. Consequently, the extension of battery-based operation time is a significant design goal which can be made possible by controlling the leakage current flowing through the CMOS gate. This article reviews the off-state leakage mechanisms like weak inversion leakage, gate induced drain leakage and channel punchthrough current. Various circuit level techniques to reduce standby leakage and their design trade-off are discussed. Based on the surveyed techniques, a designer would be able to select the appropriate leakage optimization technique for a standby mode.

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Index Terms

Computer Science
Information Sciences

Keywords

Standby leakage LECTOR GALEOR