International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 64 - Number 10 |
Year of Publication: 2013 |
Authors: D. Subalakshmi, P. S. Raghavendran |
10.5120/10668-5448 |
D. Subalakshmi, P. S. Raghavendran . Error Identification and Correction for Memory Application using Majority Logic Decoder and Detector. International Journal of Computer Applications. 64, 10 ( February 2013), 8-13. DOI=10.5120/10668-5448
Nano-memory is a new memory storage technology which may be used for memory applications such as aerospace, nano-bioengineering, etc. It provides smaller, faster and lower energy device. This technology blends together tiny carbon nano-tubes with conventional semiconductor. During encoding and decoding process, the error may occur in the codeword which results in the mismatching or loss of information. Error detection and correction are main issues in the memory which needs to be identified and corrected. The proposed method will identify the error and correct the error in the memory application using Majority Logic Decoder and Detector (MLDD). MLDD corrects the error based on number of parity check equation. This technology reduces the N-iteration to three iteration, if the codeword doesn't contain any fault. It reduces the memory access time when there is no fault in data read. However it reduces the decoding time that increase memory application. This method uses decoder to detect the failure which minimizes the area and power consumption.