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Design and Analysis of a Linear Feedback Shift Register with Reduced Leakage Power

by M. Janaki Rani, S. Malarkkan
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 56 - Number 14
Year of Publication: 2012
Authors: M. Janaki Rani, S. Malarkkan
10.5120/8957-3159

M. Janaki Rani, S. Malarkkan . Design and Analysis of a Linear Feedback Shift Register with Reduced Leakage Power. International Journal of Computer Applications. 56, 14 ( October 2012), 9-13. DOI=10.5120/8957-3159

@article{ 10.5120/8957-3159,
author = { M. Janaki Rani, S. Malarkkan },
title = { Design and Analysis of a Linear Feedback Shift Register with Reduced Leakage Power },
journal = { International Journal of Computer Applications },
issue_date = { October 2012 },
volume = { 56 },
number = { 14 },
month = { October },
year = { 2012 },
issn = { 0975-8887 },
pages = { 9-13 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume56/number14/8957-3159/ },
doi = { 10.5120/8957-3159 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T20:58:47.555526+05:30
%A M. Janaki Rani
%A S. Malarkkan
%T Design and Analysis of a Linear Feedback Shift Register with Reduced Leakage Power
%J International Journal of Computer Applications
%@ 0975-8887
%V 56
%N 14
%P 9-13
%D 2012
%I Foundation of Computer Science (FCS), NY, USA
Abstract

As the CMOS technology is scaling down, leakage power has become one of the most critical design concerns for the chip designer. This paper proposes a low leakage linear feedback shift register that can be used in a crypto-processor. In this work, three bit, four bit and five bit linear feedback shift registers are implemented in 90nm and 65nm technology . This paper also proposes two leakage reduction techniques such as reverse body bias and transistor stack, which are applied to the above circuits. The leakage power of the circuits is analyzed with and without the application of reduction techniques. The results show that for all the circuits the combined effect of (RBB + Stack ) leakage reduction method gives the least leakage power of 23. 16nW, 47. 53nWand 72. 18nW for 3-bit, 4-bit and 5-bit linear feedback shift register respectively at 90nm technology. In 65nm technology the combined leakage reduction method gives the least leakage power of 33. 86nW, 64. 73nWand 95. 14nW respectively. The circuits have been simulated with HSPICE using MOSFET models of level 54 with a supply voltage of 1 volt.

References
  1. Deepaksubramanyan, B. S. and Adrian Nunez, 2007 "Analysis of Sub-threshold Leakage Reduction in CMOS Digital Circuits", Proceedings of the 13th NASA VLSI Symposium, USA, June 5-6.
  2. International Technology Roadmap for Semiconductors: www. itrs. net/Links/2005ITRS/Design 2005. pdf.
  3. Borivoje Nikolic, 2008 "Design in the Power–Limited Scaling Regime", IEEE Transactions on Electron Devices, Vol. 55, No. 1, pp. 71-83.
  4. Yongpan Liu, Robert P. Dick, Li Shang and Huazhong Yang, 2007 "Accurate Temperature Dependent Integrated Circuit Leakage Power Estimation is Easy", EDAA.
  5. Davida, G. I. and Rodrigues, 1994 "Data Compression Using Linear Feedback Shift Registers", Proceedings of the IEEE Data Compression Conference, Los Alamitos.
  6. Moon, T. K. and Veeramachaneni. S. 1999 "Linear Feedback Shift Registers as Vector Quantisation Codebooks", Electronics Letters, Vol. 35, No. 22, pp. 1919-1920.
  7. Jamil. T and Ahmad . A. 2002 "An Investigation into the Application of Linear Feedback Shift Registers for Steganography", Proceedings of IEEE SOUTHEASTCON Conference, Columbia, pp. 239-244.
  8. Alspector, J. , Gannett, J. W. , Haber, S. , Parker, M. B. , and Chu, R. 1990 "Generating Multiple Analog Noise Sources from a Single Linear Feedback Shift Register with Neural Network", Proceedings of the IEEE International symposium on Circuits and Systems, New Orleans, Vol. 2, pp. 1058-1061.
  9. Janaki Rani M. and Malarkann S, 2012 "Leakage Power Reduction and Analysis of CMOS Sequential Circuits", International Journal of VLSI Design and Communication Systems (VLSICS), Vol. 3, No. 1. February 2012, pp. 13-23.
  10. M. C. Johnson, D. Somasekhar, L. Y. Chiou, and K. Roy, 2002, "Leakage Control with Efficient Use of transistor Stacks in Single threshold CMOS", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 10, No. 1, pp. 1-5.
  11. VasanthVenkatachalam and Michael Franz, 2005 "Power Reduction Techniques for Microprocessor Systems", ACM Computing Surveys, Vol. 37, No. 3, pp. 195-237, September.
  12. Siva Narendra, Vivek De, ShekarBorkar, Dimitri A Antonisdis and Anantha P. Chandrakasan, 2004 "Full-Chip Sub-threshold Leakage Power Prediction and Reduction Techniques for Sub 0. 18-?m CMOS", IEEE Journal of Solid State Circuits, Vol. 39, No. 2, pp. 501-510.
  13. Siva Narendra, ShekharBorkar, Vivek De, Dimitri Antoniadis, and AnanthaChandrakasan, 2001 "Scaling of Stack Effect and its Application for Leakage Reduction", ISLPED '01, pp. 195-200.
  14. Keshavarzi, A. , Narendra, S. , Borkar, S. , Hawkins, C. , Roy, K. , De, V. 1999 "Technology Scaling Behavior of Optimum Reverse Body Bias for Standby Leakage Power Reduction in CMOS IC's," International Symposium on Low Power Electronics and Design, pp 252-254.
  15. HeungJun Jeon, Yong-Bin Kim and Minsu Choi, 2010 "Standby Leakage Power Reduction Technique for Nanoscale CMOS VLSI Systems", IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 5, May,pp. 1127-1133.
Index Terms

Computer Science
Information Sciences

Keywords

Leakage power linear feedback shift register reverse body bias and transistor stack