International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 55 - Number 7 |
Year of Publication: 2012 |
Authors: Arijit Dey, Kunal Das, Debashis De, Mallika De |
10.5120/8768-2693 |
Arijit Dey, Kunal Das, Debashis De, Mallika De . Probabilistic Defect Analysis Model for Quantum dot Cellular Automata Design at Analytical Phase. International Journal of Computer Applications. 55, 7 ( October 2012), 33-41. DOI=10.5120/8768-2693
The advantage of defect analysis on Quantum dot Cellular Automata(QCA) is that defects can be predict (which are probable to arise during fabrication phase) at analytical phase of QCA design. Since QCA is probabilistic in nature, the probability theory is introduced here to analyze the defect/fault tolerance at gate level of QCA design. We proposed a Bayesian network based Probabilistic Defect Analysis Model (PDAM) to analyze the defect at analytical phase of QCA design. Proposed model is applied over QCA wire, three input Majority voter, Five Input Majority voter and the result is compared with QCADesigner to justify the importance of PDAM approach over exhaustive simulation process with QCADesigner.