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Application of Analog IC Testing Circuit
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 48 - Number 11 |
| Year of Publication: 2012 |
| Authors: Ganesh L K M, Kavita Khare, Priyanka Sharma |
10.5120/7389-0222
|
Ganesh L K M, Kavita Khare, Priyanka Sharma . Application of Analog IC Testing Circuit. International Journal of Computer Applications. 48, 11 ( June 2012), 1-3. DOI=10.5120/7389-0222
Abstract
This paper presents application of Neural classifier with High pass filter(HPF) to examine its own functional health, to speed up test time and to facilitate fault diagnosis Here we presents an application to insert a built in test block to test any complicated analog circuit in terms of performance while considering tolerance factor. Testing block which is to be added in the chip contains Synapse, Common mode canceller and current to voltage converter along with that a simple operational High pass filter ( HPF ) is taken as a CUT.
References
- Dzmitry Maliuk , Haralampos-G. Stratigopoulos and Yiorgos Makris" An Analog VLSI Multilayer Perceptron and its Application Towards Built-In Self-Test in Analog Circuits" 2010 IEEE 16th International On-Line Testing Symposium, pp. 71-76, 2010.
- V. F. Koosh and R. M. Goodmanr, "Analog VLSI neural network with digital perturbative learning," IEEE Transactions on Circuits and Systems - II, vol. 49, no. 5, pp. 359–368, 2002.
- Behzad Razavi, "Design of Analog CMOS Integrated Circuits" published by McGraw-Hill,2001,pp. 104-105,2001
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