International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 43 - Number 8 |
Year of Publication: 2012 |
Authors: Abhiraja Sharma, Virendra Kumar, Som Pachori |
10.5120/6123-8330 |
Abhiraja Sharma, Virendra Kumar, Som Pachori . Defect Prevention Technique used in Test Case for Quality Improvement. International Journal of Computer Applications. 43, 8 ( April 2012), 17-21. DOI=10.5120/6123-8330
To produce high quality software both software developers and testers need continuous improvement in their work methodologies and processes. In this paper, we develop the test case which drives from use case and applying defect classification scheme (ODC) at every test for classifying the defects. For this we conduct an exploratory study on two large web projects to identify a fault classification that is representative of and supported by real world faults. Through our study we provide support to several categories of an existing web application fault classification, and identify new fault categories. Researchers and experimenters will find the proposed fault classification useful when evaluating techniques for testing web applications