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Reseach Article

VHDL Implementation of GCD Processor with Built in Self Test Feature

by Rekha Devi, Jaget Singh, Mandeep Singh
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 25 - Number 2
Year of Publication: 2011
Authors: Rekha Devi, Jaget Singh, Mandeep Singh
10.5120/3000-4034

Rekha Devi, Jaget Singh, Mandeep Singh . VHDL Implementation of GCD Processor with Built in Self Test Feature. International Journal of Computer Applications. 25, 2 ( July 2011), 50-54. DOI=10.5120/3000-4034

@article{ 10.5120/3000-4034,
author = { Rekha Devi, Jaget Singh, Mandeep Singh },
title = { VHDL Implementation of GCD Processor with Built in Self Test Feature },
journal = { International Journal of Computer Applications },
issue_date = { July 2011 },
volume = { 25 },
number = { 2 },
month = { July },
year = { 2011 },
issn = { 0975-8887 },
pages = { 50-54 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume25/number2/3000-4034/ },
doi = { 10.5120/3000-4034 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T20:10:46.318398+05:30
%A Rekha Devi
%A Jaget Singh
%A Mandeep Singh
%T VHDL Implementation of GCD Processor with Built in Self Test Feature
%J International Journal of Computer Applications
%@ 0975-8887
%V 25
%N 2
%P 50-54
%D 2011
%I Foundation of Computer Science (FCS), NY, USA
Abstract

The Very Large Scale Integration (VLSI) has a dramatic impact on the growth of digital technology. VLSI has not only reduced the size and the cost, but also increased the complexity of the circuits. Due increase there is a problem of circuit testing, which becomes increasingly difficult as the scale of integration grows. One solution to this problem is to add logic to the IC so that it can test itself. In this paper we have design GCD (greatest common divider) processors in VHDL with BIST capability and compared the area overhead of with and without BIST.

References
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Index Terms

Computer Science
Information Sciences

Keywords

Built in Self Test VLSI Testing Greatest common Divisor Finite State Machine