CFP last date
20 December 2024
Call for Paper
January Edition
IJCA solicits high quality original research papers for the upcoming January edition of the journal. The last date of research paper submission is 20 December 2024

Submit your paper
Know more
The week's pick
Responsive image
Improved Shuffled Frog Leaping Algorithm with Self-Adaptive Shuffling for Fuzzy Logic PD+G Controller Optimization in Robotic Manipulators

Duc Hoang Nguyen
Random Articles
Reseach Article

Supervised Method for Face Photo - Sketch Synthesis and Recognition

by Shraddha V. Wankhede, Sunil V. Kuntawar
journal cover thumbnail

International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 181 - Number 7
Year of Publication: 2018
Authors: Shraddha V. Wankhede, Sunil V. Kuntawar
10.5120/ijca2018917581

Shraddha V. Wankhede, Sunil V. Kuntawar . Supervised Method for Face Photo - Sketch Synthesis and Recognition. International Journal of Computer Applications. 181, 7 ( Aug 2018), 21-26. DOI=10.5120/ijca2018917581

@article{ 10.5120/ijca2018917581,
author = { Shraddha V. Wankhede, Sunil V. Kuntawar },
title = { Supervised Method for Face Photo - Sketch Synthesis and Recognition },
journal = { International Journal of Computer Applications },
issue_date = { Aug 2018 },
volume = { 181 },
number = { 7 },
month = { Aug },
year = { 2018 },
issn = { 0975-8887 },
pages = { 21-26 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume181/number7/29785-2018917581/ },
doi = { 10.5120/ijca2018917581 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-07T01:05:18.830462+05:30
%A Shraddha V. Wankhede
%A Sunil V. Kuntawar
%T Supervised Method for Face Photo - Sketch Synthesis and Recognition
%J International Journal of Computer Applications
%@ 0975-8887
%V 181
%N 7
%P 21-26
%D 2018
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Facial Sketches are most widely used in law enforcement agencies for identification and apprehension of suspects, which may involve in several criminal activities. We plan to implement an efficient system to recognize a forensic sketch images to a gallery of mug shot images which will help law enforcement agencies. SIFT algorithm explained for feature extraction. This SIFT feature will possess strong robustness to the accessory, expression, pose, illumination variations. SIFT algorithm have highest percentage of accuracy. Faces are highly deformable objects which may easily change their appearance over time. The feature based sketch matching algorithm (SIFT) we present offers both a simpler and faster design and utilizes localized sketch information in the matching process. SIFT used for extracting local features. Scale invariant feature transform (SIFT) proposed by Lowe has been widely and successfully applied to object detection and recognition. SIFT algorithm’s ability has been leveraged through use of MATLAB code. This helps users to use SIFT algorithm very effectively to match sketches with current database images

References
  1. Tayyaba Hashmi, “Photograph Retrieval Based On FaceSketch Using Sift With PCA” International Journal of Advance Research In Science And Engineering Volume No.5, Issue No.02, February 2016.
  2. Yukti Bakhshi, Sukhvir Kaur and Prince Verma , “An improvement in face recognition for invariant faces” International journal of current engineering and technology ,Volume 6, No. 2 ,April 2016.
  3. Ashwini D. Gadekar and Sheeja S. Suresh, “Face recognition using SIFT- PCA Feature extraction and SVM classifier” IOSR journal of VLSI and Signal Processing, Volume 5 , Issue 2, April 2015.
  4. Alaa Tharwat, Hani Mahdi, Adel El Hennawy and Aboul Ella Hassanien, “Face Sketch Recognition Using Local Invariant Features” 2015 Seventh International Conference of Soft Computing and Pattern Recognition.
  5. Poonam A. Katre, “Face Authentication /Recognition System For Forensic Application Using Sketch Based On The Sift Features Approach” International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 4, April 2014’.
  6. Xue Leng and Jinhua Yang, “Research on improved SIFT algorithm” Journal of Chemical and Pharmaceutical Research, 2014, 6(7):2589-2595.
  7. Riddhi Patel and Shruti B. Yagnik , “A Literature Survey on Face Recognition Techniques” International Journal of Computer Trends and Technology (IJCTT) – volume 5 number 4 –Nov 2013.
  8. Amit R. Sharma and Prakash. R. Devale , “An application to human face photo- sketch synthesis and recognition” International Journal of Advances in Engineering & Technology, May 2012.©IJAET Vol. 3, Issue 2, pp. 395-402.
  9. B. Klare, Z. Li, and A. K. Jain, “Matching forensic sketches to mug shot photos,” IEEE Trans on Pattern Analysis and Machine Intelligence, vol. 33, no. 3 ,2011, pp. 639-646.
  10. Brendan Klare and Anil K Jain, “Sketch to photo matching : A Feature based approach” SPIE conference on Biometric Technology for Human Identification VII, 2010.
  11. Andrea Vedaldi , “An open implementation of the SIFT detector and descriptor” UCLA CSD Technical Report 070012-(2007)
  12. D. Lowe, “Distinctive image features from Scale-Invariant Keypoints,” International Journal of Computer Vision, vol. 60(2), pp. 91-110, 2004.
  13. YU MENG and Dr. Bernard Tiddeman(supervisor), “Implementing the Scale Invariant Feature Transform(SIFT) Method”.
  14. X.Tang and X. Wang, “Face photo recognition using sketch”, in image processing. 2002 proceedings,2002 international conference on vole 1. IEEE 2002, pp , I-257.
  15. R. Uhl and N. Lobo, “A framework for recognizing a facial image from a police sketch, in Proc. Int. Conf. Computer Vision and Pattern Recognition. 1996. Pp. 586593.
  16. M.Turk and A. Petland. “Eigen faces for recognition”, Journal of Cognitive Neuroscience. Vol.13, no.1, pp. 71-86, 1991.
  17. Yan Ke and Rahul Sukthankar, “PCA-SIFT: A More Distinctive Representation for Local Image Descriptors”.
Index Terms

Computer Science
Information Sciences

Keywords

Face sketch recognition image matching graphical user interface (GUI) SIFT

Powered by PhDFocusTM