International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 179 - Number 35 |
Year of Publication: 2018 |
Authors: Yash Shukla |
10.5120/ijca2018916802 |
Yash Shukla . A Review Paper on Semiconductors using Big Data. International Journal of Computer Applications. 179, 35 ( Apr 2018), 42-43. DOI=10.5120/ijca2018916802
In the Digital world there is arrival of new type of modifications. Semiconductors faced much kind of new difficulties through which the data management is very much complicated. Here “Big data” is applied to the system which results in the flexibility and speed of the manufacturing of the process. Big data will overtake the critical risk and provide friendly platform systems which are useful for the construction of the semi-conductors. To manufacture a good and stabilized semiconductor a well type of Fault Detection and Classification (FDC) has been required using big data.