CFP last date
20 January 2025
Reseach Article

An Efficient VLSI Implementation of Double Error Correction Orthogonal Latin Square Codes

by Malavika M. S., Rohith S., Venkatesh Kumar H.
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 170 - Number 6
Year of Publication: 2017
Authors: Malavika M. S., Rohith S., Venkatesh Kumar H.
10.5120/ijca2017914856

Malavika M. S., Rohith S., Venkatesh Kumar H. . An Efficient VLSI Implementation of Double Error Correction Orthogonal Latin Square Codes. International Journal of Computer Applications. 170, 6 ( Jul 2017), 21-24. DOI=10.5120/ijca2017914856

@article{ 10.5120/ijca2017914856,
author = { Malavika M. S., Rohith S., Venkatesh Kumar H. },
title = { An Efficient VLSI Implementation of Double Error Correction Orthogonal Latin Square Codes },
journal = { International Journal of Computer Applications },
issue_date = { Jul 2017 },
volume = { 170 },
number = { 6 },
month = { Jul },
year = { 2017 },
issn = { 0975-8887 },
pages = { 21-24 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume170/number6/28074-2017914856/ },
doi = { 10.5120/ijca2017914856 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-07T00:17:45.785404+05:30
%A Malavika M. S.
%A Rohith S.
%A Venkatesh Kumar H.
%T An Efficient VLSI Implementation of Double Error Correction Orthogonal Latin Square Codes
%J International Journal of Computer Applications
%@ 0975-8887
%V 170
%N 6
%P 21-24
%D 2017
%I Foundation of Computer Science (FCS), NY, USA
Abstract

There is a growing interest in multi-bit Error Correction Codes (ECCs) to protect SRAM memories. This has been caused by the increased number of multiple errors that memories suffer as technology scales. To protect an SRAM memory, an ECC has to be decodable in parallel and with low latency. Among the codes proposed for memory protection are Orthogonal Latin Square (OLS) codes that provide low latency decoding and a modular construction. It is more effective to provide different degrees of error correction for the different bits. This is done with Unequal Error Protection (UEP) codes. In this paper, UEP codes are derived from Double Error Correction (DEC) Orthogonal Latin Square (OLS) codes. The derived codes are implemented for an FPGA platform to evaluate the decoder complexity and latency. The Proposed encoder and decoder are done by Verilog HDL and Simulated by ModelSim 6.4 c and synthesized by Xilinx tool.

References
  1. N. Kanekawa, E. H. Ibe, T. Suga and Y. Uematsu, “Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances”, Springer Verlag, 2010.
  2. T.Heijmen, “Soft Errors from Space to Ground Historical Overview,” Soft Errors in Modern Electronic Systems, Springer, 2011.
  3. M. Nicolaidis, “Design for soft error mitigation”, IEEE Trans. on Device and Materials Reliability, vol. 5, no. 3, pp. 405–418, Sept. 2005.
  4. A. DeHon, N.Carter, H.Quinn, “Final Report for CCC Cross-Layer Reliability Visioning Study”, Computing Community Consortium,
  5. G.C. Cardarilli, M. Ottavi, S. Pontarelli, M. Re and A. Salsano, “Fault tolerant solid state mass memory for space applications”, IEEE Trans. Aerosp. Electron. Syst., vol. 41, no. 4, pp. 1353-1372, Oct. 2005.
  6. W. K. Huang, Y.-N. Shen, and F. Lombardi, “New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement,” IEEE Trans. Computer-Aided Des. Integr. Circuits Syst., vol. 9, no. 3, pp. 323–328, Mar. 1990.
  7. C. L. Chen and M. Y. Hsiao, “Error-correcting codes for semiconductor memory applications: a state-of-the-art review”, IBM J. Res. Develop., vol. 28, no. 2, pp. 124-134, Mar. 1984.
  8. E. Fujiwara, “Code Design for Dependable Systems: Theory and Practical Application”, John Wiley & Sons, Inc., 2006.
  9. M.Y. Hsiao “A class of optimal minimum odd-weight column SEC-DED codes”, IBM J. Res. Develop.,vol. 14, no. 4, pp. 395–301, Jul. 1970.
Index Terms

Computer Science
Information Sciences

Keywords

UEP codes OLS codes SEC-DED codes OS-MLD codes