The week's pick
Random Articles
Reseach Article
Study of Parasitic Effects of 1st Generation in 4T Relay Design
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 153 - Number 4 |
| Year of Publication: 2016 |
| Authors: Soumitra S. Pande, Sanjiv Gupta |
10.5120/ijca2016912011
|
Soumitra S. Pande, Sanjiv Gupta . Study of Parasitic Effects of 1st Generation in 4T Relay Design. International Journal of Computer Applications. 153, 4 ( Nov 2016), 57-59. DOI=10.5120/ijca2016912011
Abstract
The novel 4T Design(1), though efficient, has several parasitic effects of 1st Generation accumulated in it. These parasitic effects are discussed in this paper. After testing the prototype, it was observed that effects like body effect, drain actuation etc. are still present in the system. This paper discussed them all and provides a key to solve the issues rising from these effects.
References
- Nano-Electro-Mechanical (NEM) Relay Devices and Technology for Ultra-Low Energy Digital Integrated Circuits, Research Work, Rhesa Nathanael, 2012, University of California, Berkley
- K. Akarvardar, D. Elata, R. Parsa, G. C. Wan, K. Yoo, J. Provine, P. Peumans, R. T. Howe, and H.-S. P. Wong, “Design considerations for complementary nanoelectromechanical logic gates,” in Proc. International Electron Devices Meeting, pp. 299-302, 2014.
- F. Chen, H. Kam, D. Markovic, T. King Liu, V. Stojanovic, E. Alon, “Integrated Circuit Design with NEM Relays.” IEEE/ACM International Conference on Computer-Aided Design, pp 750-757, Nov. 2013
- H. Kam, T.-J. King Liu, E. Alon, and M. Horowitz, “Circuit level requirements for MOSFET-replacement devices,” in Proc. International Electron Devices Meeting, pp.427, 2013.
- H. Kam, V. Pott, R. Nathanael, J. Jeon, E. Alon, and T.-J. King Liu, “Design and reliability of a micro-relay technology for zero-standby-power digital logic applications,” in Proc. International Electron Devices Meeting, pp. 809-812, 2012.
- V. Pott, H. Kam, J. Jeon, and T.-J. King Liu, “Improvement in mechanical contact reliability with ALD TiO2 coating,” in Proc. AVS Conference, pp. 208-209, 2009.
- C. W. Low, T.-J. King Liu, and R. T. Howe, “Characterization of polycrystalline silicon-germanium film deposition for modularly integrated MEMS applications,” Journal of Microelectromechanical Systems, vol. 16, no. 1, pp. 68-77, Feb. 2007.
- G. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martín-Martínez, B. Kaczer, G. Groeseneken, R. Rodríguez, and M. Nafría, “Emerging yield and reliability challenges in nanometer CMOS technologies,” in Proc. IEEE Design, Automation and Test in Europe, pp. 1322–1327, Mar. 2008.
- Y. Chen, R. Nathanael, J. Jeon, J. Yaung, L. Hutin, and T.-J. K. Liu, “Characterization of contact resistance stability in MEM relays with tungsten electrodes,” IEEE/ASME Journal of Microelectromechanical Systems, vol. 21, no. 3, pp. 511-513, 2012.
- H. Kam, E. Alon, and T.-J. K. Liu, "A predictive contact reliability model for MEM logic switches," IEEE International Electron Devices Meeting Technical Digest, pp. 399-402, 2010.
Index Terms
Keywords