The week's pick
Random Articles
Reseach Article
Implication of Post Production Defects in Software Industries
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 109 - Number 17 |
| Year of Publication: 2015 |
| Authors: Divakar Harekal, Suma V |
10.5120/19419-1032
|
Divakar Harekal, Suma V . Implication of Post Production Defects in Software Industries. International Journal of Computer Applications. 109, 17 ( January 2015), 20-23. DOI=10.5120/19419-1032
Abstract
Development of defect free software is one of the primary concerns of any software industry. The main objective is to ship a high quality software product to their customers in order to attain total customer satisfaction. This is the only strategy through which industry can continue to sustain in the dynamic market. Hence, several defect management techniques are followed to reduce the defect leakage count during their production cycle. Nevertheless, the efforts laid by expert professionals in unearthing the maximum defects, yet there still prevails unidentified defects entering the customer's site. Unawareness to post production defects results in rework and overheads which is not an appreciable solution to the industry. The aim of this paper is therefore to investigate the implication of post production defects in software industries. This understanding facilitates the developing team to overcome the rate of defect injection during the production span such that post production defect leakage is reduced.
References
- J. Clerk Maxwell, A Treatise on Electricity and Magnetism, 3rd ed. , vol. 2. Oxford: Clarendon, 1892, pp. 68–73.
- Grady Booch, Robert A. Maksimchuk, Michael W. Engel, Bobbi J. Young, Jim Conallen and Kelli A. Houston: Object-Oriented Analysis and Design with Applications, Third Edition, Addison Wesley Professional publisher, 2007, ISBN-10: 020189551X, ISBN-13: 978-0201895513.
- Grady Booch: Object-Oriented Analysis and Design with Applications, Second Edition, Addison-Wesley publisher, 1994, ISBN 0-8053-5340-2.
- Watts S. Humphrey: Defect Prevention, In Managing the Software Process, Addison-Wesley publisher, Boston, USA, 1989.
- Gerald M. Weinberg: Quality Software Management: Systems Thinking, Dorset House publisher, 1997, ISBN-10: 0932633226, ISBN-13: 978-0932633224.
- Ram Chillarege: The Marriage of Business Dynamics and Software Engineering, IEEE Software, Vol. 19, No. 6, 2002, pp. 43-49.
- Ramaswamy. V, Pushpavathi T. P. , Suma. V, "Position Paper: Defect Prediction Approaches for Software Projects Using Genetic Fuzzy Data Mining", 48th Annual Convention, Computer Society of India, Vishakapattanam Chapter, 13th -15th December 2013, Vishakapattanam, India.
- Suma. V, Pushpavathi T. P. , Ramaswamy. V, "An Approach to Predict Software Project Success by Data Mining Clustering", International Conference on Data Mining Computer, Communication and Mechanical Engineering (ICDCCME) 2012, 21st-22nd December, Bangkok, Thailand.
- Ramaswamy. V, Suma. V, Pushpavathi. T. P, "An Approach To Predict Software Project Success By Cascading Clustering And Classification", International Conference on Software Engineering and Mobile Application Modeling and Development (ICSEMA) 2012, 19th – 21st December, Chennai, India.
- T. R. Gopalakrishnan Nair, V. Suma, Nitya G. Nair, "Estimation of Characteristics of a Software Team for Implementing Effective Inspection Process Inspection performance Metric", Software Quality Professional Journal, American Society for Quality (ASQ), USA, Vol. 13, Issue 2, pp. 14-26, 2011.
- T. R. Gopalakrishnan Nair, V. Suma, "Defect Management Using Pair Metrics, DI and IPM" CrossTalk, The Journal of Defense Software Engineering, Vol. 24, No 6, 2011, pp. 22-27, 2011.
- T. R. Gopalakrishnan Nair, V. Suma, "Implementation of Depth of Inspection Metric and Inspection Performance Metric for Quality Management in Software Development Life Cycle" International Journal of Productivity and Quality Management (IJPQM), InderScience Publishers, USA, 2011.
- T. R. Gopalakrishnan Nair, V. Suma, "A Paradigm for Metric Based Inspection Process for Enhancing Defect Management", ACM SIGSOFT Software Engineering Notes, vol. 35, No. 3, pp. 1, 2010.
- T. R. Gopalakrishnan Nair, V. Suma, Pranesh Tiwari, "Significance of Depth of Inspection and Inspection Performance Metrics for Consistent Defect Management in Software Industry", IET Software, December 2012, Volume 6, Issue 6, pp. 524 – 535.
- T. R. Gopalakrishnan Nair, Suma. V, Pranesh Kumar Tiwari, "Analysis of Test Efficiency during Software Development Process", Submitted, 2nd Annual International Conference on Software Engineering and Applications (SEA 2011), Singapore, 12th -13th December 2011.
- Rashmi N, Suma V. , "Defect Detection Efficiency of the Combined Approach of Testing", 48th Annual Convention, Computer Society of India, Vishakapattanam Chapter, 13th -15th December 2013, Vishakapattanam, India.
- Rashmi N, Suma V. , "Defect Detection Efficiency: A Combined approach", International Conference on Emerging Trends Technology and Research (ICETTR-2013), 21st -22nd September 2013, Nagpur, Maharashtra, India.
- Jef Jacobs, Jan Vol Moll, Rob Kusters, Jos Trienekens and Aarnout Brombacher: Identification of Factors that Influence Defect Injection and Detection in Development of Software Intensive Products, Information and Software Technology Journal, Vol. 49, No. 7, 2007, pp. 774-789.
Index Terms
Keywords