International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 109 - Number 11 |
Year of Publication: 2015 |
Authors: V. Mohan, S. Suresh Kumar |
10.5120/19234-0993 |
V. Mohan, S. Suresh Kumar . An Automated Tiles Defect Detection. International Journal of Computer Applications. 109, 11 ( January 2015), 24-27. DOI=10.5120/19234-0993
It presents an automatic defect identification system for detecting crack of titles from captured digital images based on defect classification and segmentation. Image classification will be used for automated visual inspection to classify defect and protects from quality one. It will be performed through textures analysis and probabilistic neural network. The textures are extracted using wavelet filters with cooccurrence features. The defect detection process involves the preprocessing, segmentation and morphological filtering to make processing system more flexible with accuracy.