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Reseach Article

Comparative Analysis of Metastability with D FLIP FLOP in CMOS Circuits

by Manisha Thakur, Puran Gaur, Braj Bihari Soni
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 103 - Number 16
Year of Publication: 2014
Authors: Manisha Thakur, Puran Gaur, Braj Bihari Soni
10.5120/18160-9383

Manisha Thakur, Puran Gaur, Braj Bihari Soni . Comparative Analysis of Metastability with D FLIP FLOP in CMOS Circuits. International Journal of Computer Applications. 103, 16 ( October 2014), 26-29. DOI=10.5120/18160-9383

@article{ 10.5120/18160-9383,
author = { Manisha Thakur, Puran Gaur, Braj Bihari Soni },
title = { Comparative Analysis of Metastability with D FLIP FLOP in CMOS Circuits },
journal = { International Journal of Computer Applications },
issue_date = { October 2014 },
volume = { 103 },
number = { 16 },
month = { October },
year = { 2014 },
issn = { 0975-8887 },
pages = { 26-29 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume103/number16/18160-9383/ },
doi = { 10.5120/18160-9383 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T22:34:45.403137+05:30
%A Manisha Thakur
%A Puran Gaur
%A Braj Bihari Soni
%T Comparative Analysis of Metastability with D FLIP FLOP in CMOS Circuits
%J International Journal of Computer Applications
%@ 0975-8887
%V 103
%N 16
%P 26-29
%D 2014
%I Foundation of Computer Science (FCS), NY, USA
Abstract

The appropriate choice of flip-flop topologies is of essential importance in the design of integrated circuits for CMOS VLSI high-performance and high-speed circuits. The understanding of the suitability of the flip-flops and select the best topology for a given application is important to meet the need of the design to meet low power and high performance circuit subject. This work shows a wide area comparison exist in D flip-flop, this provides a wide study of the topologies in terms of power dissipation, delay, and rise delay and fall delay time.

References
  1. David Rennie, DavidLi, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, ShiJieWen, and Richard Wong "Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS" IEEE Transactions On Circuits And Systems—I: Regular Papers, Vol. 59, No. 8, August 2012 pp no 1626.
  2. Haiqing Nan and Ken Choi "High Performance, Low Cost, and Robust Soft Error Tolerant Latch Designs for Nanoscale CMOS Technology" IEEE Transactions on Circuits and Systems—I: Regular Papers, Vol. 59, No. 7, July 2012 pp no 1445.
  3. David J. Rennie,and Manoj Sachdev "Novel Soft Error Robust Flip-Flops in 65nm CMOS" IEEE Transactions On Nuclear Science, Vol. 58, No. 5, October 2011 pp no. 2470.
  4. Pedro M. Figueiredo "Comparator Metastability in the Presence of Noise" IEEE Transactions, on circuits and Systems I: Regular Papers year 2012 pp no 1549.
  5. Mr Jun Zhou,Mr David J. Kinniment , Mr Charles E. Dike,and Mr Gordon Russell "On-Chip Measurement of Deep Metastability in Synchronizers" IEEE Journal Of Solid-State Circuits, Vol. 43, No. 2, in year 2008. pp no. 550.
  6. Keith A. Bowman, James W. Tschanz, Nam Sung Kim, Janice C. Lee, Chris B. Wilkerson, Shih-Lien L. Lu,Tanay Karnik, and Vivek K. De "Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance" IEEE Journal Of Solid-State Circuits, Vol. 44, No. 1, January 2009, pp no. 49.
  7. Ch. Daya Sagar, T. Krishna Moorthy, "Design of a Low Power Flip-Flop Using MTCMOS Technique" International Journal of Computer Applications & Information Technology Vol. 1, No. 1, July 2012.
  8. R. Uma, "Flip-Flop Circuit Families: Comparison of Layout and Topology for Low Power VLSI Circuits" International Journal of Engineering Research and Applications (IJERA) ISSN: 2248-9622 www. ijera. com, Vol. 1, Issue 4, pp. 1971-1982.
  9. Kavita Mehta, Neha Arora, Prof. B. P. Singh, "Low Power Efficient D Flip Flop Circuit" International Symposium on Devices MEMS, Intelligent Systems & Communication (ISDMISC) 2011, Proceedings published by International Journal of Computer Applications (IJCA).
  10. Haiqing Nan and Ken Choi, "High Performance, Low Cost, and Robust Soft Error Tolerant Latch Designs for Nano scale CMOS Technology" IEEE Transactions on Circuits and Systems—I: Regular Papers, VOL. 59, No. 7, July 2012.
Index Terms

Computer Science
Information Sciences

Keywords

Metastability D Latch Flip-Flop Microwind.